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"Testability-Driven Layout of Combinational Circuits."

C. P. Ravikumar, Nikhil Sharma (1998)

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DOI: 10.1155/1998/10193

access: open

type: Journal Article

metadata version: 2023-05-08

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  - https://dblp.org/rec/journals/vlsi/RavikumarS98
C. P. Ravikumar, Nikhil Sharma:
Testability-Driven Layout of Combinational Circuits. VLSI Design 7(4): 347-352 (1998)

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