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ORCID"A Novel Scan Architecture for Low Power Scan-Based Testing."
Mahshid Mojtabavi Naeini, Chia Yee Ooi (2015)
- Mahshid Mojtabavi Naeini, Chia Yee Ooi:
A Novel Scan Architecture for Low Power Scan-Based Testing. VLSI Design 2015: 264071:1-264071:13 (2015)
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