Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Operational and Test Performance in the Presence of Built-in Current Sensors."

Sankaran M. Menon et al. (1997)

> Home

Details and statistics

DOI: 10.1155/1997/54757

access: open

type: Journal Article

metadata version: 2022-11-05

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/vlsi/MenonMJT97
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/vlsi/MenonMJT97
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong:
Operational and Test Performance in the Presence of Built-in Current Sensors. VLSI Design 5(3): 285-298 (1997)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.