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"Fault Modeling of ECL for High Fault Coverage of Physical Defects."

Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana (1996)

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DOI: 10.1155/1996/80472

access: open

type: Journal Article

metadata version: 2022-11-07

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  dblp key:
  - journals/vlsi/MenonMJ96
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  persistent URL:
  - https://dblp.org/rec/journals/vlsi/MenonMJ96
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana:
Fault Modeling of ECL for High Fault Coverage of Physical Defects. VLSI Design 4(3): 231-242 (1996)

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