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"Integrated Test Solutions for a System Design Environment."

Kevin T. Kornegay, Robert W. Brodersen (1994)

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DOI: 10.1155/1994/39791

access: open

type: Journal Article

metadata version: 2022-12-06

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  - journals/vlsi/KornegayB94
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  - https://dblp.org/rec/journals/vlsi/KornegayB94
Kevin T. Kornegay, Robert W. Brodersen:
Integrated Test Solutions for a System Design Environment. VLSI Design 1(4): 345-357 (1994)

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