Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Program, Erase and Retention Times of Thin-oxide Flash-EEPROMs."

Giuseppe Iannaccone, S. Gennai (2001)

> Home

Details and statistics

DOI: 10.1155/2001/62583

access: open

type: Journal Article

metadata version: 2023-05-08

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/vlsi/IannacconeG01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/vlsi/IannacconeG01
Giuseppe Iannaccone, S. Gennai:
Program, Erase and Retention Times of Thin-oxide Flash-EEPROMs. VLSI Design 13(1-4): 431-434 (2001)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.