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"Impact Ionization and Hot-Electron Injection Derived Consistently from ..."
Paul E. Hasler et al. (1998)
- Paul E. Hasler, Andreas G. Andreou, Chris Diorio, Bradley A. Minch, Carver A. Mead:
Impact Ionization and Hot-Electron Injection Derived Consistently from Boltzmann Transport. VLSI Design 8(1-4): 454-461 (1998)
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