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"Impact of Scaling on CMOS Chip Failure Rate, and Design Rules for Hot ..."

Amr Haggag et al. (2001)

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DOI: 10.1155/2001/90787

access: open

type: Journal Article

metadata version: 2023-05-08

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Amr Haggag, William McMahon, Karl Hess, Björn Fischer, Leonard F. Register:
Impact of Scaling on CMOS Chip Failure Rate, and Design Rules for Hot Carrier Reliability. VLSI Design 13(1-4): 111-115 (2001)

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