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"Fault Characterization and Testability Analysis of Emitter Coupled Logic ..."

Michael Ogbonna Esonu, Dhamin Al-Khalili, Côme Rozon (1994)

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DOI: 10.1155/1994/70696

access: open

type: Journal Article

metadata version: 2022-11-10

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  - journals/vlsi/EsonuAR94
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  - https://dblp.org/rec/journals/vlsi/EsonuAR94
Michael Ogbonna Esonu, Dhamin Al-Khalili, Côme Rozon:
Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS Circuits. VLSI Design 1(4): 261-276 (1994)

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