"Detection of defects in voltage-dependent resistors using ..."

Tiejun Yang, Tianshu Zhang, Lin Huang (2021)

> Home

Details and statistics

DOI: 10.1007/S00371-020-01901-W

access: closed

type: Journal Article

metadata version: 2023-06-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/vc/YangZH21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/vc/YangZH21
Tiejun Yang, Tianshu Zhang, Lin Huang:
Detection of defects in voltage-dependent resistors using stacked-block-based convolutional neural networks. Vis. Comput. 37(6): 1559-1567 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.