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"Postvoiding FEM Analysis for Electromigration Failure Characterization."

Hengyang Zhao, Sheldon X.-D. Tan (2018)

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DOI: 10.1109/TVLSI.2018.2861358

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/ZhaoT18
Hengyang Zhao, Sheldon X.-D. Tan:
Postvoiding FEM Analysis for Electromigration Failure Characterization. IEEE Trans. Very Large Scale Integr. Syst. 26(11): 2483-2493 (2018)

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