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"Automatic Test Program Generation Using Executing-Trace-Based Constraint ..."

Ying Zhang, Huawei Li, Xiaowei Li (2013)

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DOI: 10.1109/TVLSI.2012.2208130

access: closed

type: Journal Article

metadata version: 2023-05-11

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Ying Zhang, Huawei Li, Xiaowei Li:
Automatic Test Program Generation Using Executing-Trace-Based Constraint Extraction for Embedded Processors. IEEE Trans. Very Large Scale Integr. Syst. 21(7): 1220-1233 (2013)

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