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"BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under ..."

Ying Zhang et al. (2022)

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DOI: 10.1109/TVLSI.2022.3186946

access: closed

type: Journal Article

metadata version: 2023-05-11

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Ying Zhang, Yi Ding, Zebo Peng, Huawei Li, Masahiro Fujita, Jianhui Jiang:
BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature. IEEE Trans. Very Large Scale Integr. Syst. 30(11): 1677-1690 (2022)

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