"Fast and Accurate Emissivity and Absolute Temperature Maps Measurement for ..."

Hsueh-Ling Yu et al. (2018)

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DOI: 10.1109/TVLSI.2017.2788437

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type: Journal Article

metadata version: 2022-12-13

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Hsueh-Ling Yu, Yih-Lang Li, Tzu-Yi Liao, Tianchen Wang, Shu-Fei Tsai, Yiyu Shi:
Fast and Accurate Emissivity and Absolute Temperature Maps Measurement for Integrated Circuits. IEEE Trans. Very Large Scale Integr. Syst. 26(5): 912-923 (2018)

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