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"Impacts of NBTI/PBTI and Contact Resistance on Power-Gated SRAM With ..."

Hao-I Yang, Wei Hwang, Ching-Te Chuang (2011)

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DOI: 10.1109/TVLSI.2010.2049038

access: closed

type: Journal Article

metadata version: 2020-03-11

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Hao-I Yang, Wei Hwang, Ching-Te Chuang:
Impacts of NBTI/PBTI and Contact Resistance on Power-Gated SRAM With High-kappa Metal-Gate Devices. IEEE Trans. Very Large Scale Integr. Syst. 19(7): 1192-1204 (2011)

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