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"A Low Overhead High Test Compression Technique Using Pattern Clustering ..."
Seongmoon Wang, Wenlong Wei, Zhanglei Wang (2010)
- Seongmoon Wang, Wenlong Wei, Zhanglei Wang:
A Low Overhead High Test Compression Technique Using Pattern Clustering With $n$-Detection Test Support. IEEE Trans. Very Large Scale Integr. Syst. 18(12): 1672-1685 (2010)
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