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"Gate oxide leakage and delay tradeoffs for dual-T_ox circuits."

Anup Kumar Sultania, Dennis Sylvester, Sachin S. Sapatnekar (2005)

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DOI: 10.1109/TVLSI.2005.862723

access: closed

type: Journal Article

metadata version: 2021-07-28

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Anup Kumar Sultania, Dennis Sylvester, Sachin S. Sapatnekar:
Gate oxide leakage and delay tradeoffs for dual-T_ox circuits. IEEE Trans. Very Large Scale Integr. Syst. 13(12): 1362-1375 (2005)

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