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"Testing complex couplings in multiport memories."

Michael Nicolaidis, Vladimir Castro Alves, Hakim Bederr (1995)

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DOI: 10.1109/92.365454

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/NicolaidisAB95
Michael Nicolaidis, Vladimir Castro Alves, Hakim Bederr:
Testing complex couplings in multiport memories. IEEE Trans. Very Large Scale Integr. Syst. 3(1): 59-71 (1995)

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