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"Mitigating BTI-Induced Degradation in STT-MRAM Sensing Schemes."

Ing-Chao Lin, Yun Kae Law, Yuan Xie (2018)

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DOI: 10.1109/TVLSI.2017.2764520

access: closed

type: Journal Article

metadata version: 2020-03-11

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  dblp key:
  - journals/tvlsi/LinLX18
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  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/LinLX18
Ing-Chao Lin, Yun Kae Law, Yuan Xie:
Mitigating BTI-Induced Degradation in STT-MRAM Sensing Schemes. IEEE Trans. Very Large Scale Integr. Syst. 26(1): 50-62 (2018)

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