default search action
"On Reducing Test Power and Test Volume by Selective Pattern Compression ..."
Chia-Yi Lin, Hsiu-Chuan Lin, Hung-Ming Chen (2010)
- Chia-Yi Lin, Hsiu-Chuan Lin, Hung-Ming Chen:
On Reducing Test Power and Test Volume by Selective Pattern Compression Schemes. IEEE Trans. Very Large Scale Integr. Syst. 18(8): 1220-1224 (2010)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.