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"Delay fault testing of IP-based designs via symbolic path modeling."

HyungWon Kim, John P. Hayes (2001)

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DOI: 10.1109/92.953500

access: closed

type: Journal Article

metadata version: 2020-03-11

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HyungWon Kim, John P. Hayes:
Delay fault testing of IP-based designs via symbolic path modeling. IEEE Trans. Very Large Scale Integr. Syst. 9(5): 661-678 (2001)

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