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"A Study on Bandgap Reference Circuit With Leakage-Based PTAT Generation."

Youngwoo Ji et al. (2018)

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DOI: 10.1109/TVLSI.2018.2852802

access: closed

type: Journal Article

metadata version: 2020-03-11

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  dblp key:
  - journals/tvlsi/JiKPS18
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  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/JiKPS18
Youngwoo Ji, Byungsub Kim, Hong-June Park, Jae-Yoon Sim:
A Study on Bandgap Reference Circuit With Leakage-Based PTAT Generation. IEEE Trans. Very Large Scale Integr. Syst. 26(11): 2310-2321 (2018)

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