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"Fault Diagnosis for Resistive Random Access Memory and Monolithic ..."

Shao-Chun Hung et al. (2024)

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DOI: 10.1109/TVLSI.2024.3380549

access: closed

type: Journal Article

metadata version: 2024-07-19

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  - https://dblp.org/rec/journals/tvlsi/HungCBC24
Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty:
Fault Diagnosis for Resistive Random Access Memory and Monolithic Inter-Tier Vias in Monolithic 3-D Integration. IEEE Trans. Very Large Scale Integr. Syst. 32(7): 1336-1349 (2024)

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