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"Embedded Test Decompressor to Reduce the Required Channels and Vector ..."

Yinhe Han et al. (2007)

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DOI: 10.1109/TVLSI.2007.893652

access: closed

type: Journal Article

metadata version: 2023-05-23

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Yinhe Han, Yu Hu, Xiaowei Li, Huawei Li, Anshuman Chandra:
Embedded Test Decompressor to Reduce the Required Channels and Vector Memory of Tester for Complex Processor Circuit. IEEE Trans. Very Large Scale Integr. Syst. 15(5): 531-540 (2007)

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