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"Scalable Methods for Analyzing the Circuit Failure Probability Due to Gate ..."

Jianxin Fang, Sachin S. Sapatnekar (2012)

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DOI: 10.1109/TVLSI.2011.2166568

access: closed

type: Journal Article

metadata version: 2020-03-11

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Jianxin Fang, Sachin S. Sapatnekar:
Scalable Methods for Analyzing the Circuit Failure Probability Due to Gate Oxide Breakdown. IEEE Trans. Very Large Scale Integr. Syst. 20(11): 1960-1973 (2012)

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