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"Initialization-Based Test Pattern Generation for Asynchronous Circuits."

Aristides Efthymiou (2010)

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DOI: 10.1109/TVLSI.2009.2013470

access: closed

type: Journal Article

metadata version: 2023-09-30

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Aristides Efthymiou:
Initialization-Based Test Pattern Generation for Asynchronous Circuits. IEEE Trans. Very Large Scale Integr. Syst. 18(4): 591-601 (2010)

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