"Defect Diagnosis via Segment Delay Learning."

Jaeyong Chung, Woochul Kang (2016)

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DOI: 10.1109/TVLSI.2015.2392092

access: closed

type: Journal Article

metadata version: 2020-03-11

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Jaeyong Chung, Woochul Kang:
Defect Diagnosis via Segment Delay Learning. IEEE Trans. Very Large Scale Integr. Syst. 24(1): 388-392 (2016)

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