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"Low-Overhead Triple-Node-Upset-Tolerant Latch Design in 28-nm CMOS."

Xin Chen et al. (2023)

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DOI: 10.1109/TVLSI.2023.3274632

access: closed

type: Journal Article

metadata version: 2023-07-07

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  - https://dblp.org/rec/journals/tvlsi/ChenBCWZZ023
Xin Chen, Yuxin Bai, Jianpeng Cao, Lei Wang, Xinjie Zhou, Ying Zhang, Weiqiang Liu:
Low-Overhead Triple-Node-Upset-Tolerant Latch Design in 28-nm CMOS. IEEE Trans. Very Large Scale Integr. Syst. 31(7): 1039-1050 (2023)

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