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"Built-In Self-Test of High-Density and Realistic ILV Layouts in Monolithic ..."

Arjun Chaudhuri et al. (2023)

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DOI: 10.1109/TVLSI.2022.3228850

access: closed

type: Journal Article

metadata version: 2023-03-11

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Arjun Chaudhuri, Sanmitra Banerjee, Jinwoo Kim, Sung Kyu Lim, Krishnendu Chakrabarty:
Built-In Self-Test of High-Density and Realistic ILV Layouts in Monolithic 3-D ICs. IEEE Trans. Very Large Scale Integr. Syst. 31(3): 296-309 (2023)

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