"Deterministic built-in test pattern generation for high-performance ..."

Krishnendu Chakrabarty, Brian T. Murray, Vikram Iyengar (2000)

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DOI: 10.1109/92.894170

access: closed

type: Journal Article

metadata version: 2022-01-03

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Krishnendu Chakrabarty, Brian T. Murray, Vikram Iyengar:
Deterministic built-in test pattern generation for high-performance circuits using twisted-ring counters. IEEE Trans. Very Large Scale Integr. Syst. 8(5): 633-636 (2000)

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