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"On the invariance, coincidence, and statistical equivalence of the GLRT, ..."

Antonio De Maio, Steven M. Kay, Alfonso Farina (2010)

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DOI: 10.1109/TSP.2009.2039728

access: closed

type: Journal Article

metadata version: 2020-03-10

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Antonio De Maio, Steven M. Kay, Alfonso Farina:
On the invariance, coincidence, and statistical equivalence of the GLRT, rao test, and wald test. IEEE Trans. Signal Process. 58(4): 1967-1979 (2010)

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