"Deep-reasoning fault diagnosis: an aid and a model."

Wan Chui Yoon, John M. Hammer (1988)

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DOI: 10.1109/21.17383

access: closed

type: Journal Article

metadata version: 2020-05-20

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Wan Chui Yoon, John M. Hammer:
Deep-reasoning fault diagnosis: an aid and a model. IEEE Trans. Syst. Man Cybern. 18(4): 659-676 (1988)

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