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"A decision support system for the design of a large electronics test facility."

John J. Shaw, Krishna R. Pattipati, James C. Deckert (1991)

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DOI: 10.1109/21.97474

access: closed

type: Journal Article

metadata version: 2020-05-20

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  - journals/tsmc/ShawPD91
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  - https://dblp.org/rec/journals/tsmc/ShawPD91
John J. Shaw, Krishna R. Pattipati, James C. Deckert:
A decision support system for the design of a large electronics test facility. IEEE Trans. Syst. Man Cybern. 21(3): 533-544 (1991)

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