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"Developer Micro Interaction Metrics for Software Defect Prediction."

Taek Lee et al. (2016)

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DOI: 10.1109/TSE.2016.2550458

access: closed

type: Journal Article

metadata version: 2022-01-03

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  - https://dblp.org/rec/journals/tse/LeeNHKI16
Taek Lee, Jaechang Nam, DongGyun Han, Sunghun Kim, Hoh Peter In:
Developer Micro Interaction Metrics for Software Defect Prediction. IEEE Trans. Software Eng. 42(11): 1015-1035 (2016)

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