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"DefectChecker: Automated Smart Contract Defect Detection by Analyzing EVM ..."

Jiachi Chen et al. (2022)

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DOI: 10.1109/TSE.2021.3054928

access: closed

type: Journal Article

metadata version: 2022-08-08

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Jiachi Chen, Xin Xia, David Lo, John Grundy, Xiapu Luo, Ting Chen:
DefectChecker: Automated Smart Contract Defect Detection by Analyzing EVM Bytecode. IEEE Trans. Software Eng. 48(7): 2189-2207 (2022)

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