"Detecting Bugs by Discovering Expectations and Their Violations."

Pan Bian et al. (2019)

> Home

Details and statistics

DOI: 10.1109/TSE.2018.2816639

access: closed

type: Journal Article

metadata version: 2023-08-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tse/Bian0ZYS019
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tse/Bian0ZYS019
Pan Bian, Bin Liang, Yan Zhang, Chaoqun Yang, Wenchang Shi, Yan Cai:
Detecting Bugs by Discovering Expectations and Their Violations. IEEE Trans. Software Eng. 45(10): 984-1001 (2019)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.