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"Parametric Yield Modeling and Simulations of FPGA Circuits Considering ..."

N. Pete Sedcole, Peter Y. K. Cheung (2008)

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DOI: 10.1145/1371579.1371582

access: closed

type: Journal Article

metadata version: 2020-04-24

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N. Pete Sedcole, Peter Y. K. Cheung:
Parametric Yield Modeling and Simulations of FPGA Circuits Considering Within-Die Delay Variations. ACM Trans. Reconfigurable Technol. Syst. 1(2): 10:1-10:28 (2008)

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