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"IoT-TEG 4.0: A New Approach 4.0 for Test Event Generation."

Antonio Velez-Estevez, Lorena Gutiérrez-Madroñal, Inmaculada Medina-Bulo (2022)

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DOI: 10.1109/TR.2021.3087781

access: open

type: Journal Article

metadata version: 2023-08-28

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  - journals/tr/Velez-EstevezGM22
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  - https://dblp.org/rec/journals/tr/Velez-EstevezGM22
Antonio Velez-Estevez, Lorena Gutiérrez-Madroñal, Inmaculada Medina-Bulo:
IoT-TEG 4.0: A New Approach 4.0 for Test Event Generation. IEEE Trans. Reliab. 71(3): 1368-1380 (2022)

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