


default search action
"Detection and Reliability Risks of Counterfeit Electrolytic Capacitors."
Anshul Shrivastava et al. (2014)
- Anshul Shrivastava
, Michael H. Azarian
, Carlos Morillo
, Bhanu P. Sood, Michael G. Pecht
:
Detection and Reliability Risks of Counterfeit Electrolytic Capacitors. IEEE Trans. Reliab. 63(2): 468-479 (2014)

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.