"Bayesian Methods for Accelerated Destructive Degradation Test Planning."

Ying Shi, William Q. Meeker (2012)

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DOI: 10.1109/TR.2011.2170115

access: closed

type: Journal Article

metadata version: 2020-07-09

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Ying Shi, William Q. Meeker:
Bayesian Methods for Accelerated Destructive Degradation Test Planning. IEEE Trans. Reliab. 61(1): 245-253 (2012)

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