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"Guest Editorial Celebrating 75 Years of Excellence: The Enduring Legacy ..."

Jason W. Rupe, Phil Laplante, Shiuhpyng Winston Shieh (2024)

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DOI: 10.1109/TR.2024.3366027

access: closed

type: Journal Article

metadata version: 2024-07-03

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Jason W. Rupe, Phil Laplante, Shiuhpyng Winston Shieh:
Guest Editorial Celebrating 75 Years of Excellence: The Enduring Legacy and Future Outlook of the IEEE Reliability Society. IEEE Trans. Reliab. 73(1): 3-6 (2024)

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