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"A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown ..."

Seong-Joon Kim, Tao Yuan, Suk Joo Bae (2016)

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DOI: 10.1109/TR.2015.2456183

access: closed

type: Journal Article

metadata version: 2020-07-09

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Seong-Joon Kim, Tao Yuan, Suk Joo Bae:
A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides. IEEE Trans. Reliab. 65(1): 263-271 (2016)

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