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"Accelerated Destructive Degradation Tests Robust to Distribution ..."

Shuen-Lin Jeng, Bei-Ying Huang, William Q. Meeker (2011)

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DOI: 10.1109/TR.2011.2161051

access: closed

type: Journal Article

metadata version: 2020-07-09

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Shuen-Lin Jeng, Bei-Ying Huang, William Q. Meeker:
Accelerated Destructive Degradation Tests Robust to Distribution Misspecification. IEEE Trans. Reliab. 60(4): 701-711 (2011)

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