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"Using Bayesian Networks to Accurately Calculate the Reliability of ..."

Walid Ibrahim, Valeriu Beiu (2011)

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DOI: 10.1109/TR.2011.2161032

access: closed

type: Journal Article

metadata version: 2021-04-09

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Walid Ibrahim, Valeriu Beiu:
Using Bayesian Networks to Accurately Calculate the Reliability of Complementary Metal Oxide Semiconductor Gates. IEEE Trans. Reliab. 60(3): 538-549 (2011)

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