"Development test programs for 1-shot systems: 2-state reliability and ..."

Mu-Yeh Huang, D. McBeth, Stephen B. Vardeman (1996)

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DOI: 10.1109/24.536989

access: closed

type: Journal Article

metadata version: 2020-07-09

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Mu-Yeh Huang, D. McBeth, Stephen B. Vardeman:
Development test programs for 1-shot systems: 2-state reliability and binary development-test results. IEEE Trans. Reliab. 45(3): 379-385 (1996)

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