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"HMM-Based Joint Modeling of Condition Monitoring Signals and Failure Event ..."

Akash Deep et al. (2023)

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DOI: 10.1109/TR.2022.3193353

access: closed

type: Journal Article

metadata version: 2023-09-24

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Akash Deep, Shiyu Zhou, Dharmaraj Veeramani, Yong Chen:
HMM-Based Joint Modeling of Condition Monitoring Signals and Failure Event Data for Prognosis. IEEE Trans. Reliab. 72(3): 878-888 (2023)

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