"Tweedie Exponential Dispersion Processes for Degradation Modeling, ..."

Zhen Chen et al. (2020)

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DOI: 10.1109/TR.2019.2955596

access: closed

type: Journal Article

metadata version: 2025-04-12

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Zhen Chen, Tangbin Xia, Yanting Li, Ershun Pan:
Tweedie Exponential Dispersion Processes for Degradation Modeling, Prognostic, and Accelerated Degradation Test Planning. IEEE Trans. Reliab. 69(3): 887-902 (2020)

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