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"Predicting Patch Correctness Based on the Similarity of Failing Test Cases."

Haoye Tian et al. (2022)

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DOI: 10.1145/3511096

access: closed

type: Journal Article

metadata version: 2024-05-07

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Haoye Tian, Yinghua Li, Weiguo Pian, Abdoul Kader Kaboré, Kui Liu, Andrew Habib, Jacques Klein, Tegawendé F. Bissyandé:
Predicting Patch Correctness Based on the Similarity of Failing Test Cases. ACM Trans. Softw. Eng. Methodol. 31(4): 77:1-77:30 (2022)

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