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"A Dynamic Huffman Coding Method for Reliable TLC NAND Flash Memory."

Chin-Hsien Wu et al. (2021)

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DOI: 10.1145/3446771

access: closed

type: Journal Article

metadata version: 2021-07-19

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  - https://dblp.org/rec/journals/todaes/WuZLYY21
Chin-Hsien Wu, Hao-Wei Zhang, Chia-Wei Liu, Ta-Ching Yu, Chi-Yen Yang:
A Dynamic Huffman Coding Method for Reliable TLC NAND Flash Memory. ACM Trans. Design Autom. Electr. Syst. 26(5): 34:1-34:25 (2021)

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