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"Multimode scan: Test per clock BIST for IP cores."
Adit D. Singh et al. (2003)
- Adit D. Singh, Markus Seuring, Michael Gössel, Egor S. Sogomonyan:
Multimode scan: Test per clock BIST for IP cores. ACM Trans. Design Autom. Electr. Syst. 8(4): 491-505 (2003)
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